JPH0428067Y2 - - Google Patents

Info

Publication number
JPH0428067Y2
JPH0428067Y2 JP1984072073U JP7207384U JPH0428067Y2 JP H0428067 Y2 JPH0428067 Y2 JP H0428067Y2 JP 1984072073 U JP1984072073 U JP 1984072073U JP 7207384 U JP7207384 U JP 7207384U JP H0428067 Y2 JPH0428067 Y2 JP H0428067Y2
Authority
JP
Japan
Prior art keywords
contact
lead
lead part
measured
contactor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP1984072073U
Other languages
English (en)
Japanese (ja)
Other versions
JPS60183879U (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP7207384U priority Critical patent/JPS60183879U/ja
Publication of JPS60183879U publication Critical patent/JPS60183879U/ja
Application granted granted Critical
Publication of JPH0428067Y2 publication Critical patent/JPH0428067Y2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP7207384U 1984-05-15 1984-05-15 半導体試験装置の接触子 Granted JPS60183879U (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7207384U JPS60183879U (ja) 1984-05-15 1984-05-15 半導体試験装置の接触子

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7207384U JPS60183879U (ja) 1984-05-15 1984-05-15 半導体試験装置の接触子

Publications (2)

Publication Number Publication Date
JPS60183879U JPS60183879U (ja) 1985-12-06
JPH0428067Y2 true JPH0428067Y2 (en]) 1992-07-07

Family

ID=30610144

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7207384U Granted JPS60183879U (ja) 1984-05-15 1984-05-15 半導体試験装置の接触子

Country Status (1)

Country Link
JP (1) JPS60183879U (en])

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008031742A (ja) * 2006-07-28 2008-02-14 Raiteku:Kk 雪崩・落石等防護体の支柱とその製造用補助具

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5385234B2 (ja) * 2010-09-21 2014-01-08 富士通テレコムネットワークス株式会社 コンタクトプローブおよび充放電装置
WO2013001910A1 (ja) * 2011-06-27 2013-01-03 Ｊｘ日鉱日石エネルギー株式会社 太陽電池セルの測定治具
JPWO2013001911A1 (ja) * 2011-06-27 2015-02-23 Ｊｘ日鉱日石エネルギー株式会社 太陽電池セルの測定治具

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4957370A (en]) * 1972-10-04 1974-06-04
JPS5040753A (en]) * 1973-08-13 1975-04-14
JPS5733416Y2 (en]) * 1977-05-13 1982-07-23
JPS58180953A (ja) * 1982-04-15 1983-10-22 Mitsubishi Electric Corp 測定装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008031742A (ja) * 2006-07-28 2008-02-14 Raiteku:Kk 雪崩・落石等防護体の支柱とその製造用補助具

Also Published As

Publication number Publication date
JPS60183879U (ja) 1985-12-06

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